IEEE Design & Test
September/October 2002

Features

Guest Editors' Introduction: Defect-Oriented Testing in the Deep-Submicron
Era
Jaume Segura and Peter Maxwell

IDDQ Test: Will It Survive the DSM Challenge?
Sagar S. Sabade and D.M.H. Walker

Resistance Characterization for Weak Open Defects
Rosa Rodr­guez Montaá©s, Paul Volf,  and Jos© Pineda de Gyvez

Noise Generation and Coupling Mechanisms in Deep-Submicron ICs
Xavier Aragon¨s, Jose Luis Gonz¡lez,  Francesc Moll, and Antonio Rubio

Leakage and Process Variation Effects in Current Testing on Future CMOS
Circuits
Ali Keshavarzi, James W. Tschanz, Siva Narendra, Vivek De, Kaushik Roy,
Charles F. Hawkins, W. Robert Daasch,  and Manoj Sachdev

High Defect Coverage with Low-Power Test Sequences in a BIST Environment
Patrick Girard, Christian Landrault,  Serge Pravossoudovitch, Arnaud
Virazel, and Hans-Joachim Wunderlich

Special ITC Section

Guest Editors' Introduction: Stressing the Fundamentals
Robert C. Aitken and Donald L. Wheater

Efficient Sequential Test Generation Based on Logic Simulation
Shuo Sheng and Michael S. Hsiao

Extending OPMISR Beyond 10x Scan Test Efficiency
Carl Barnhart, Vanessa Brunkhorst,  Frank Distler, Owen Farnsworth,
Andrew Ferko, Brion Keller,  David Scott, Bernd Koenemann,
and Takeshi Onodera

Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort
W. Robert Daasch, James McNames,  Robert Madge, and Kevin Cota

Multilevel Testability Analysis and Solutions for Integrated Bluetooth
Transceivers
Sule Ozev, Christian V. Olgaard,  and Alex Orailoglu

Special Feature

Virtual Simulation of Distributed IP-Based Designs
Marcello Dalpasso, Alessandro Bogliolo, and Luca Benini

Departments

EIC Message

Roundtable

Conference Reports

TTTC Newsletter

DATC Newsletter

Panel Summaries

---------------------------------------------------

If you wish to be removed from this mailing list, send a message
to listserv@computer.org with the following text in the body of the
message:

    unsubscribe dt_subscribers

---------------------------------------------------